Social Media

Abstract

Starting in FY 2022, the Vetting Risk Operations (VRO) will develop and implements a scalable capability to include Publicly Available Electronic Information (PAEI), including social media, into background investigations in accordance with Security Executive Agent Directive 5 (SEAD 5) and aligned to the Trusted Workforce 2.0 personnel vetting reform initiative. VRO access to PAEI also fulfills the Secretary's requirements to improve the vetting of International Military Students who intend to or are currently receiving training within the continental U.S. The investment develops collecting, collating and assessment tools for PAEI, including social media, in support of national security eligibility determinations. DoD studies have identified PAEI as a unique data source to identify key behaviors that are potentially derogatory under the Allegiance, Foreign Influence, Foreign Preference, and Personal Conduct guidelines of the National Security Adjudication Guidelines. Data received from PAEI is often not found anywhere else in the course of the personnel vetting cycle. To utilize PAEI within the Department, on a national security population of ~3.6 million individuals, the Department is developing a scalable, cost effective, and automated capability. A PAEI investment will deliver a capability flexible to policy requirements, and emerging threats, while simultaneously able to constantly monitor millions of people on hundreds of social media platforms with billions of individual data points, aggregate and curate that data, identify potential risk, and seamlessly provide notification in a digestible analytical product to a human for risk mitigation.

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Document Details

Document Type
Project
Publication Date
Oct 01, 2023
Source ID
000_0305128V_7_0400_PB_2023

Tags

Readers

  • Agent-Based Social Robotics and Mobile-Assisted Learning in Virtual Environments.
  • Cybersecurity.
  • Enterprise Information Systems Architecture and Joint Command Capability Interoperability Support.

Technology Areas

  • Microelectronics

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