Advanced X-Ray Integrated Sources (AXIS)

Abstract

The objective of the Advanced X-Ray Integrated Sources (AXIS) program was to develop tunable, mono-energetic, spatially coherent X-ray sources with greatly reduced size, weight and power while dramatically increasing their electrical efficiency through application of micro-scale engineering technologies such as micro- and nano-electromechanical systems (MEMS and NEMS). Such X-ray sources enable new versatile imaging modalities based on phase contrast techniques which are 1000x more sensitive than the conventional absorption contrast imaging. Such imaging modalities should enable design verification of integrated circuits to validate trustworthiness as well as Forward Surgical Team imaging of soft tissues and vascular injuries from blunt trauma without the injection of a contrast enhancing agent. The radiation dose required for imaging will also be reduced. The Basic Research component of this effort focused on defining the fundamental science necessary for the creation of compact and highly efficient synchrotron X-ray sources. These sources may lead to future developments in the medical imaging field based on tunable X-ray wavelengths.

Document Details

Document Type
Accomplishment
Publication Date
Oct 01, 2015
Source ID
01ccbe92f59275a3935b72e267b858b6

Tags

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Integrated Circuit Design and Technology.
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Microelectronics

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