Characterizing the source properties of terrestrial gamma ray flashes

Abstract

Monte Carlo simulations are used to determine source properties of terrestrial gamma ray flashes (TGFs) as a function of atmospheric column depth and beaming geometry. The total mass per unit area traversed by all the runaway electrons (i.e., the total grammage) during a TGF, Ξ, is introduced, defined to be the total distance traveled by all the runaway electrons along the electric field lines multiplied by the local air mass density along their paths. It is shown that key properties of TGFs may be directly calculated from Ξ and its time derivative, including the gamma ray emission rate, the current moment, and the optical power of the TGF. For the calculations presented in this paper, a standard TGF gamma ray fluence, F0 = 0.1 cm−2 above 100 keV for a spacecraft altitude of 500 km, and a standard total grammage, Ξ0 = 1018 g/cm2, are introduced, and results are presented in terms of these values. In particular, the current moments caused by the runaway electrons and their accompanying ionization are found for a standard TGF fluence, as a function of source altitude and beaming geometry, allowing a direct comparison between the gamma rays measured in low‐Earth orbit and the VLF‐LF radio frequency emissions recorded on the ground. Such comparisons should help test and constrain TGF models and help identify the roles of lightning leaders and streamers in the production of TGFs.

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2017
Source ID
10.1002/2017ja024141

Entities

People

  • David Smith
  • Hamid K Rassoul
  • J. Eric Grove
  • J. R. Dwyer
  • Ningyu Liu

Organizations

  • Air Force Office of Scientific Research
  • Florida Institute of Technology
  • United States Naval Research Laboratory
  • University of California
  • University of New Hampshire

Tags

Fields of Study

  • Physics

Readers

  • Pulsed Power and Plasma Physics.
  • Space/Atmospheric Physics.
  • Statistical inference.

Technology Areas

  • Microelectronics
  • Space