Characterization of Grain Boundary‐Engineered Aluminum–Magnesium Alloys

Abstract

Herein, the effect of sputtering rate on the fraction of special grain boundaries in 5xxx series Al–Mg alloys is explored. Samples are synthesized via interrupted direct current (DC) magnetron sputtering with varying deposition rates, and the grain size and grain boundary character are evaluated with electron backscatter diffraction (EBSD). The highest sputtering rate (7 nm s−1) leads to an increase in the total number of special grain boundaries, ≈1.5× greater than that of the lower rates. Increased thermal energy and enhanced stress relaxation during film growth promote the formation of Σ3 and Σ7 boundaries.

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 03, 2020
Source ID
10.1002/adem.202000813

Entities

People

  • Andrea Maria Hodge
  • Joel A. Bahena
  • Karina D. Hemmendinger

Organizations

  • Office of Naval Research
  • University of Southern California

Tags

Fields of Study

  • Materials science

Readers

  • Powder metallurgy of Titanium alloys.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene