Unraveling the Electrical and Magnetic Properties of Layered Conductive Metal‐Organic Framework With Atomic Precision
Abstract
This paper describes structural elucidation of a layered conductive metal‐organic framework (MOF) material Cu3(C6O6)2 by microcrystal electron diffraction with sub‐angstrom precision. This insight enables the first identification of an unusual π‐stacking interaction in a layered MOF material characterized by an extremely short (2.73 Å) close packing of the ligand arising from pancake bonding and ordered water clusters within pores. Band structure analysis suggests semiconductive properties of the MOF, which are likely related to the localized nature of pancake bonds and the formation of a singlet dimer of the ligand. The spin of CuII within the Kagomé arrangement dominates the paramagnetism of the MOF, leading to strong geometrical magnetic frustration.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 17, 2021
- Source ID
- 10.1002/anie.202113569
Entities
People
- Christopher G. Jones
- Hosea Nelson
- Islam Ullah Khan
- Katherine A. Mirica
- Sidra Farid
- Zheng Meng
Organizations
- Army Research Office
- California Institute of Technology
- Cold Regions Research and Engineering Laboratory
- Dartmouth College
- David and Lucile Packard Foundation
- Government College University
- National Science Foundation of Sri Lanka
- The Camille and Henry Dreyfus Foundation
- Yusuf Hamied Department of Chemistry