POSS‐inducedrheological and dielectric modification of polyethersulfone

Abstract

Polyhedral oligomeric silsesquioxane (POSS) nanostructured chemicals, when incorporated at low levels in thermoplastics, provide processability enhancement and viscosity reduction without compromising other bulk physical properties. POSS has been relatively unexplored in high performance polymers, and there is incomplete understanding of the mechanisms by which POSS produces flow improvements. In this study, polyethersulfone (PES) was melt‐blended with trisilanolphenyl (TSP)‐POSS and dodecaphenyl (DP)‐POSS; and rheological, dielectric spectroscopy, and scanning electron microscopy evaluations were conducted to identify structure/property/processing relationships. TSP‐POSS yielded greater processability improvements and viscosity reductions than DP‐POSS, suppressed low temperature relaxations to a larger extent, and displayed a greater degree of nanoscale dispersion in the polymer matrix. The findings are evaluated in terms of competing theories of POSS viscosity reduction.

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 08, 2021
Source ID
10.1002/app.50537

Entities

People

  • Beibei Chen
  • Jacob A. Cross
  • Jin Gyu Park
  • John K. Newman
  • Lisa K. Kemp
  • Nicholas Smith
  • Rahul Shankar
  • Sarah E Morgan
  • Sergei I. Nazarenko
  • Travis L. Thornell

Organizations

  • Engineer Research and Development Center
  • Florida State University
  • University of Southern Mississippi

Tags

Fields of Study

  • Materials science

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Polymer Science and Engineering.
  • Polymer Science and Technology

Technology Areas

  • Microelectronics