Dielectric characterization of thin films using microstrip ring resonators
Abstract
This article presents a microstrip ring resonator technique for characterizing thin film substrates up to 110 GHz. A coupling structure was designed to efficiently couple energy into rings despite the tight microstrip‐substrate confinement. Various ring sizes are designed and fabricated, and both dielectric constant and loss tangent results are presented. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:2306–2310, 2015
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 29, 2015
- Source ID
- 10.1002/mop.29321
Entities
People
- Benjamin C. Olbricht
- David L. K. Eng
- Dennis W. Prather
- Shouyuan Shi
Organizations
- Air Force Office of Scientific Research
- University of Delaware