Phase‐controlled epitaxial growth of iron oxide thin films on MgO(001) and LaAlO3(001) substrates
Abstract
We have deposited epitaxial iron oxide thin films on MgO(001) and LaAlO3(LAO)(001) substrates, resulting in different phase stabilities. Atomic force microscopy images revealed a smooth surface. Detailed X‐ray diffraction (XRD) measurements were performed to confirm the epitaxial growth and to analyze the atomic growth configuration. We found that (00l) oriented γ‐Fe2O3 was the stable phase on MgO(001) substrates, whereas $ (1\bar 102) $ oriented α‐Fe2O3 was stable on LAO(001). Magnetic hysteresis loop measurements revealed typical ferrimagnetic behavior for γ‐Fe2O3 on MgO, whereas the magnetization of α‐Fe2O3 on LAO was relatively small and consistent with an antiferromagnetic order. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 07, 2011
- Source ID
- 10.1002/pssr.201105458
Entities
People
- Bolin Hu
- D. Viehland
- Jie‐fang Li
- Ravindranath Viswan
- Vincent G. Harris
- Zhiguang Wang
Organizations
- Air Force Office of Scientific Research
- United States Department of Energy