Inducing dendrite formation using an Atomic Force Microscope tip
Abstract
Atomic force microscope (AFM) tip‐induced nucleation, and dendrite growth of vapor deposited PETN films on Si (100) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2‐D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary. SCANNING 30: 228–231, 2008. © 2008 Wiley Periodicals, Inc.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- May 01, 2008
- Source ID
- 10.1002/sca.20108
Entities
People
- Brandon L. Weeks
- Gengxin Zhang
Organizations
- Office of Naval Research