The use of subgrains as imaged in the SEM from bulk specimens in the study of localized plasticity
Abstract
The ability to image subgrains in the SEM by channeling contrast affords the opportunity to study localized plasticity and quantify parameters not previously measurable. This paper examines some of the ways in which subgrain information may be used in the study of fatigue and creep phenomena. Fatigue crack tip stress range and the work required to form a fatigue crack may be estimated. An example of the measurement of subgrain misorientation due to creep is also given.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 1979
- Source ID
- 10.1002/sca.4950020404
Entities
People
- D. L. Davidson
Organizations
- Office of Naval Research