Thermo-Mechanical Stress in High-Frequency Vacuum Electron Devices

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 16, 2016
Source ID
10.1007/s10762-016-0312-7

Entities

People

  • Bahram Ravani
  • Diana Gamzina
  • Neville C. Luhmann Jr.

Organizations

  • National Science Foundation
  • United States Department of Defense
  • United States Department of Energy

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems