Sensitivity analysis for an electron transport system: application to the case of wurtzite gallium nitride

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 26, 2019
Source ID
10.1007/s10825-019-01424-1

Entities

People

  • John Chilleri
  • Michael S. Shur
  • Robert M. Kirby
  • Stephen K. O’Leary
  • Yanyan He

Organizations

  • United States Army Research Laboratory

Tags

Technology Areas

  • Microelectronics