Impact of oxygen concentration at the HfOx/Ti interface on the behavior of HfOx filamentary memristors

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2022
Source ID
10.1007/s10853-022-07067-1

Entities

People

  • Eric M Vogel
  • Fabia Farlin Athena
  • Jinho Hah
  • Matthew P. West
  • Riley Hanus
  • Samuel Graham

Organizations

  • Air Force Office of Scientific Research