Band Offset Characterization of the Atomic Layer Deposited Aluminum Oxide on m-Plane Indium Nitride
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 09, 2015
- Source ID
- 10.1007/s11664-015-4175-9
Entities
People
- Amir M. Dabiran
- Joseph A. Gardella Jr.
- Joshua S. Wallace
- Uttam Singisetti
- Ye Jia
- Yueling Qin
Organizations
- Office of Naval Research