Band Offset Characterization of the Atomic Layer Deposited Aluminum Oxide on m-Plane Indium Nitride

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 09, 2015
Source ID
10.1007/s11664-015-4175-9

Entities

People

  • Amir M. Dabiran
  • Joseph A. Gardella Jr.
  • Joshua S. Wallace
  • Uttam Singisetti
  • Ye Jia
  • Yueling Qin

Organizations

  • Office of Naval Research