Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 19, 2018
- Source ID
- 10.1007/s11664-018-6214-9
Entities
People
- A. B. Jarjour
- A. Hyland
- Benjamin Wang
- D. C. Look
- Geoffrey M. Foster
- H. Von Wenckstern
- Hongjun Gao
- Jason Cox
- Leonard J Brillson
- M. Grundmann
- M. W. Allen
- W. T. Ruane
Organizations
- German Research Foundation
- National Science Foundation
- Office of Naval Research