On the interfacial phase growth and vacancy evolution during accelerated electromigration in Cu/Sn/Cu microjoints

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2018
Source ID
10.1016/j.actamat.2018.08.049

Entities

People

  • Raymundo Arróyave
  • Supriyo Ghosh
  • Thien Duong
  • Vahid Attari

Organizations

  • National Science Foundation
  • United States Army Research Laboratory