Impurity and texture driven HCP-to-FCC transformations in Ti-X thin films during in situ TEM annealing and FIB milling

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2020
Source ID
10.1016/j.actamat.2019.11.047

Entities

People

  • Andrew M. Minor
  • James O. Douglas
  • Josh Kacher
  • Paul A J Bagot
  • Rachel Traylor
  • Ruopeng Zhang

Organizations

  • Office of Naval Research
  • United States Department of Energy
  • University of Oxford