Indexing of electron back-scatter diffraction patterns using a convolutional neural network

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2020
Source ID
10.1016/j.actamat.2020.08.046

Entities

People

  • E. Pascal
  • M. De Graef
  • Z. Ding

Organizations

  • Carnegie Mellon University
  • National Science Foundation
  • Office of Naval Research

Tags

Technology Areas

  • AI & ML
  • AI & ML - Neural Networks
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems