Automated detection of part quality during two-photon lithography via deep learning
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 01, 2020
- Source ID
- 10.1016/j.addma.2020.101444
Entities
People
- Brian Giera
- Soumik Sarkar
- Sourabh K Saha
- Xian Yeow Lee
Organizations
- Defense Advanced Research Projects Agency
- Lawrence Livermore National Laboratory