Multilayer graphene, Moiré patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 01, 2014
- Source ID
- 10.1016/j.carbon.2014.08.028
Entities
People
- C.r. Eddy, Jr.
- D. Kurt Gaskill
- D. Qi
- F.m. Peeters
- J.k. Schoelz
- Jesse E. Thompson
- L.o. Nyakiti
- M. Neek-amal
- P.m. Thibado
- Peipeng Xu
- R.l. Myers-ward
- V.d. Wheeler
Organizations
- National Science Foundation
- Office of Naval Research