A Raman spectroscopy signature for characterizing defective single-layer graphene: Defect-induced I(D)/I(D′) intensity ratio by theoretical analysis
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Aug 01, 2015
- Source ID
- 10.1016/j.carbon.2015.03.049
Entities
People
- Ahmad E Islam
- Benji Maruyama
- Faisal Mehmood
- Jie Jiang
- John J. Boeckl
- Ruth Pachter
Organizations
- Air Force Research Laboratory