Multiscale simulation of the responses of discrete nanostructures to extreme loading conditions based on the material point method

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2015
Source ID
10.1016/j.cma.2015.08.009

Entities

People

  • Shan Jiang
  • Thomas D. Sewell
  • Yong Gan
  • Zhen Chen

Organizations

  • Defense Threat Reduction Agency
  • National Natural Science Foundation of China

Tags

Technology Areas

  • Microelectronics