MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 01, 2021
- Source ID
- 10.1016/j.commatsci.2021.110281
Entities
People
- Dane Morgan
- Maciej P. Polak
Organizations
- Air Force Office of Scientific Research
- National Science Foundation