Defect-induced Raman spectroscopy in single-layer graphene with boron and nitrogen substitutional defects by theoretical investigation

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2016
Source ID
10.1016/j.cplett.2016.09.067

Entities

People

  • Ahmad E Islam
  • Benji Maruyama
  • Jie Jiang
  • John J. Boeckl
  • Ruth Pachter

Organizations

  • Air Force Office of Scientific Research

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene