Density-based errors in mixed-basis mean-field electronic structure, with implications for embedding and QM/MM methods

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2017
Source ID
10.1016/j.cplett.2017.04.059

Entities

People

  • Feizhi Ding
  • Frederick R. Manby
  • Kaito Miyamoto
  • Sebastian J.r. Lee
  • Thomas F. Miller Iii

Organizations

  • Engineering and Physical Sciences Research Council
  • Office of Science
  • United States Army Research Laboratory

Tags

Technology Areas

  • Microelectronics