Depth-Resolved Composition and Electronic Structure of Buried Layers and Interfaces in a LaNiO3/SrTiO3 Superlattice from Soft- and Hard- X-ray Standing-Wave Angle-Resolved Photoemission

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2016
Source ID
10.1016/j.elspec.2016.04.008

Entities

People

  • A. Blanca-romero
  • A. Bostwick
  • A. Janotti
  • A. Keqi
  • A. Rattanachata
  • A.a. Greer
  • A.m. Kaiser
  • A.x. Gray
  • A.y. Saw
  • C.g. Van De Walle
  • C.m. Schneider
  • C.s. Fadley
  • D. Eiteneer
  • E. Rotenberg
  • E.m. Gullikson
  • G.k. Pálsson
  • Galen Conti
  • J. Lebeau
  • J. Son
  • K. Kobayashi
  • R. Pentcheva
  • S. Nemšák
  • S. Stemmer
  • S. Ueda

Organizations

  • Army Research Office
  • Forschungszentrum Jülich
  • Labex (Sweden)
  • Lawrence Berkeley National Laboratory
  • National Institute for Materials Science
  • National Science Foundation
  • Office of Basic Energy Sciences
  • Swedish Research Council
  • University of California, Davis

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene