Analysis and simulation for a model of electron impact excitation/deexcitation and ionization/recombination

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2015
Source ID
10.1016/j.jcp.2015.07.027

Entities

People

  • Bokai Yan
  • Farzin Barekat
  • Jean-luc Cambier
  • Russel E. Caflisch

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory

Tags

Technology Areas

  • Microelectronics