Study of InAs/InAsSb type-II superlattices using high-resolution x-ray diffraction and cross-sectional electron microscopy

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2013
Source ID
10.1016/j.jcrysgro.2013.06.021

Entities

People

  • David J Smith
  • Hua Li
  • S. Liu
  • Xiao-Meng Shen
  • Yong-hang Zhang

Organizations

  • Air Force Office of Scientific Research

Tags

Technology Areas

  • Microelectronics