Annealing behavior and electrical properties of atomic layer deposited PbTiO3 and PZT films

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2018
Source ID
10.1016/j.jcrysgro.2018.04.004

Entities

People

  • Aaron Welsh
  • Daniel M. Potrepka
  • Gary S. Tompa
  • Jung In Yang
  • Nick M. Sbrockey
  • Ronald G. Polcawich
  • Susan Trolier-McKinstry

Organizations

  • Army Research Office