The influence of the substrate misorientation on the structural quality of GaN layers grown by HVPE

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2018
Source ID
10.1016/j.jcrysgro.2018.07.010

Entities

People

  • Michal Boćkowski
  • R. Dos Reis
  • Tomasz Sochacki
  • Z. Liliental-weber

Organizations

  • National Science Centre Poland
  • Office of Naval Research
  • Office of Science