IP determination and 1+1 REMPI spectrum of SiO at 210–220 nm in an ion trap: Implications for SiO+ ion trap loading

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2019
Source ID
10.1016/j.jms.2018.11.008

Entities

People

  • Brian Odom
  • Ivan O. Antonov
  • Patrick Stollenwerk

Organizations

  • Army Research Office
  • Office of Naval Research