Neural electrode resilience against dielectric damage may be improved by use of highly doped silicon as a conductive material

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1016/j.jneumeth.2017.10.002

Entities

People

  • Florian Solzbacher
  • Loren Rieth
  • Matthew G. Street
  • Pavel A. Takmakov
  • Prashant Tathireddy
  • Rohit Sharma
  • Ryan Caldwell

Organizations

  • Food and Drug Administration
  • National Institutes of Health
  • National Science Foundation