Ion irradiation induced changes in defects of iron thin films: Electron microscopy and positron annihilation spectroscopy

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2019
Source ID
10.1016/j.jnucmat.2019.151774

Entities

People

  • Bradley R. Johnson
  • Dan J. Edwards
  • John S. McCloy
  • Ke Xu
  • Marc H. Weber
  • Weilin Jiang
  • Yue Cao

Organizations

  • Battelle Memorial Institute
  • Nuclear Energy Enabling Technologies
  • Office of Nuclear Energy
  • United States Army Research Laboratory
  • United States Department of Energy

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene