Analysis of copper ion filaments and retention of dual-layered devices for resistance random access memory applications

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2009
Source ID
10.1016/j.mee.2009.03.102

Entities

People

  • Chunhum Cho
  • Dong-jun Seong
  • Hyejung Choi
  • Hyunsang Hwang
  • Jaesik Yoon
  • Joonmyoung Lee
  • Ju-bong Park
  • Seonghyun Kim
  • Wootae Lee

Organizations

  • Gwangju Institute of Science and Technology
  • Ministry of Education, Science and Technology
  • United States Naval Research Laboratory