AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2020
Source ID
10.1016/j.mee.2020.111214

Entities

People

  • C. Cabral Jr
  • F. Stellari
  • Peng Song
  • R. Laibowitz

Organizations

  • Defense Advanced Research Projects Agency