Processor-level reliability simulator for time-dependent gate dielectric breakdown

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2015
Source ID
10.1016/j.micpro.2015.10.002

Entities

People

  • Chang-chih Chen
  • Linda Milor
  • Soonyoung Cha
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency
  • Georgia Tech
  • National Chiao Tung University
  • National Science Foundation