System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2015
Source ID
10.1016/j.microrel.2015.06.008

Entities

People

  • Chang-chih Chen
  • Linda Milor
  • Soonyoung Cha
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation