Comprehensive reliability and aging analysis on SRAMs within microprocessor systems

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2015
Source ID
10.1016/j.microrel.2015.06.078

Entities

People

  • Chang-chih Chen
  • Linda Milor
  • Taizhi Liu
  • Woongrae Kim

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation