The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2015
Source ID
10.1016/j.microrel.2015.06.105

Entities

People

  • Dae-hyun Kim
  • Linda Milor
  • Soonyoung Cha
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation