Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2015
Source ID
10.1016/j.microrel.2015.07.048

Entities

People

  • A. Sasikumar
  • A.r. Arehart
  • B. Poling
  • B. Winningham
  • E. Heller
  • G.d. Via
  • Steven A. Ringel

Organizations

  • Office of Naval Research