Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2015
Source ID
10.1016/j.microrel.2015.08.019

Entities

People

  • Donald L. Dorsey
  • Eric J. Heller
  • Jason P. Jones
  • Samuel Graham

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory