Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2016
Source ID
10.1016/j.microrel.2015.10.026

Entities

People

  • A. Sasikumar
  • A.r. Arehart
  • Christine M. Jackson
  • D.w. Cardwell
  • Steven A. Ringel
  • Weiqin Sun
  • Zhicai Zhang

Organizations

  • Office of Naval Research
  • Ohio State University
  • Semiconductor Research Corporation