Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2016
Source ID
10.1016/j.microrel.2015.11.007

Entities

People

  • A. Sasikumar
  • A.r. Arehart
  • B. Poling
  • E.r. Heller
  • G.d. Via
  • Steven A. Ringel

Organizations

  • Office of Naval Research
  • Semiconductor Research Corporation