Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2017
Source ID
10.1016/j.microrel.2017.06.039

Entities

People

  • Dae-hyun Kim
  • Linda Milor

Organizations

  • Defense Advanced Research Projects Agency