Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2017
Source ID
10.1016/j.microrel.2017.06.040

Entities

People

  • Kexin Yang
  • Linda Milor
  • Rui Zhang
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency