In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM)
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 01, 2017
- Source ID
- 10.1016/j.microrel.2017.07.042
Entities
People
- C. Shashank Kaira
- Carl R. Mayer
- Ehsan Izadi
- Jagannathan Rajagopalan
- Nikhilesh Chawla
- Renuka Vallabhaneni
- Sudhanshu S. Singh
Organizations
- Air Force Office of Scientific Research