Heavy ion irradiation effects on GaN/AlGaN high electron mobility transistor failure at off-state

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2019
Source ID
10.1016/j.microrel.2019.113493

Entities

People

  • Aman Haque
  • Angela L. Paoletta
  • Anthony M. Monterrosa
  • Jennifer D. Schuler
  • Khalid Hattar
  • Nicholas R Glavin
  • Timothy J. Rupert
  • Zahabul Islam

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation
  • United States Department of Energy

Tags

Technology Areas

  • Microelectronics