On the stochastic nature of conductive points formation and their effects on reliability of MoS2 RRAM: Experimental characterization and Monte Carlo simulation

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2021
Source ID
10.1016/j.microrel.2021.114274

Entities

People

  • Deji Akinwande
  • Jack C. Lee
  • Ruijing Ge
  • Xiaohan Wu
  • Yifu Huang
  • Yuqian Gu

Organizations

  • Army Research Office
  • National Science Foundation