Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 01, 2022
- Source ID
- 10.1016/j.microrel.2022.114714
Entities
People
- C. De Santi
- Chen Shang
- E. Hughes
- E. Zanoni
- G. Meneghesso
- J. Bowers
- M. Buffolo
- M. Meneghini
- M. Zenari
- R.w. Herrick
- Yongshan Wan
Organizations
- Defense Advanced Research Projects Agency
- Ministry of Education, Universities and Research