Concurrent characterization of GaN MOSHEMT gate leakage via electrical and thermoreflectance measurements

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2023
Source ID
10.1016/j.microrel.2023.115122

Entities

People

  • Ali Shakouri
  • David Kortge
  • Kerry Maize
  • Peide Ye
  • Peter A. Bermel
  • Xiao Lyu

Organizations

  • National Science Foundation
  • Office of Naval Research
  • United States Department of Energy